FEI Titan 80-300 S/TEM
The Titan is a Transmission Electron Microscope (TEM) outfitted with a CEOS spherical aberration corrector allowing imaging at a resolution below 0.1 nm, roughly the size of an atom.
Capabilities: HR-TEM, EELS, elemental mapping with EDX
FEI Nova Nanolab
Duo-Beam workstation (SEM and FIB) fitted with platinum and oxide deposition capabilities. Its fields of application range from HR-SEM to elemental analysis to failure analysis.
Capabilities: SEM imaging, FIB etching, Micro-machining, elemental mapping with EDX
LEICA SP5 II Confocal OM
Produces high resolution optical slices of tissues stained with multiple dyes in a flexible and user-friendly platform. The multi-photon capability also allows imaging of thick specimens with reduced phototoxic effects, bringing the possibility of true in-vivo imaging closer than ever.
PHI Versa Probe XPS
Capable of detailed elemental and chemical analysis. It is also designed for rapid spatially resolved analysis of solid surfaces. It is fitted with Ar and C60 guns allowing depth-profiling of elemental composition.
Panalytical MPD and MRD X-Ray Diffractometers
Designed for the identification and structural determination of bulk and powder materials.
Capabilities: Hot stage for In-Situ runs, Texture Mapping, Phase Identification with extensive databases of materials
Facility Access and User Support
Access is managed through structured training and staff support. Contact our Director of the Materials Characterization Facility for more details on training and support.
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